ESDAK specializes in semiconductor measurement equipment. With over 10 years of experience, we will help you find the tool that best suits your needs:
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- Ellipsometry for measuring and mapping thickness and refractive index of single and multi-layer dielectrics on both insulating. conducting, and semiconducting surfaces. With multi-angle, multi-wavelength in the blue to IR region. Over 200 systems in California alone and offering a reliability second to none. Windows 95 compatible software now available with measurement speed of less than 0.5 seconds per point.
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- WT-85 SPV TOOL Cost effective SPV and µ-PCD tool for both production and R&D applications.
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- SIRM-300 Bulk Microdefect Analyzer for both wafer manufacturers and incoming QC.
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- DLS-83D Deep Level Spectrometer for identification of impurities such as Fe and Cu.
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| Used Equipment |
We can provide almost any type of used metrology equipment, please fill out our :
CONTACT FORM specifying your requirements and we will respond with both price and delivery times. You may also call us for a quote (408) 691-5527
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